{"id":999,"date":"2018-07-19T10:01:53","date_gmt":"2018-07-19T13:01:53","guid":{"rendered":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/?page_id=999"},"modified":"2018-08-20T11:46:16","modified_gmt":"2018-08-20T14:46:16","slug":"sbmicro-invited-talk","status":"publish","type":"page","link":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbmicro-invited-talk\/","title":{"rendered":"SBMicro Invited Talk: Gilson Inacio Wirth"},"content":{"rendered":"

Gilson Inacio Wirth<\/span>
\nFederal University of Rio Grande do Sul – Brazil
\n<\/span><\/strong>Wednesday, Aug. 29 –\u00a013:40h – Malbec A<\/span>
\n<\/strong><\/p>\n

\"\"

Gilson Wirth<\/p><\/div>\n

SBCCI INVITED TALK:
\nCharge Trapping Phenomena in MOSFETS: From Noise to Bias Temperature Instability<\/strong><\/h2>\n

Charge capture and emission by defects (traps) close to the Dielectric-Semiconductor interface is known to be the major source of low-frequency noise in modern MOS devices. It is also known to play a role in Bias Temperature Instability (BTI). The basics mechanisms involved in charge trapping and de-trapping will be presented, including a critical discussion of key parameters such as trapping\/de-trapping time constants and the amplitude of the fluctuations induced by single traps. Standard low-frequency noise models used today (e.g. BSIM) do not properly model noise behavior under large signal excitation, and often do not to properly model noise variability. A novel physics based modeling and simulation approach will be presented. It is based on the relevant microscopic quantities that play a role in both low-frequency noise and BTI. The modeling approach is valid at both DC and large signal (AC) biasing, and may be applied to time domain (transient) and frequency domain (AC) analysis. Mutual relation between the different reliability phenomena (low-frequency noise, BTI and random dopant fluctuations – RDF) is also studied. For instance, RDF may exacerbate the impact of BTI and low-frequency noise on circuit performance. Additionally, the LF-noise (and BTI) levels from device-to-device can vary several orders of magnitude in deeply-scaled devices, making variability a major concern in advanced MOS technologies. Therefore, to assure proper circuit design in this scenario, it is necessary to identify the fundamental mechanisms responsible for variability in LF-noise and BTI. We introduced a new variability-based analysis, employing the autocorrelation of multiple LF-Noise spectra in terms of parameters such as frequency, bias and temperature. This technique reveals information about the mechanisms responsible for the LF-noise (and BTI) that is difficult to obtain otherwise.<\/p>\n

Speaker’s Biography:<\/strong><\/h2>\n

Gilson I. Wirth received the B.S.E.E and M.Sc. degrees from the Universidade Federal do Rio Grande do Sul, Brazil, in 1990 and 1994, respectively. In 1999 he received the Dr.-Ing. degree in Electrical Engineering from the University of Dortmund, Dortmund, Germany.
\nHe is currently a professor at the Electrical Engineering Department at the Universidade Federal do Rio Grande do Sul – UFRGS (since January 2007), where he was the head of graduate and undergraduate courses.
\nFrom July 2002 to December 2006 he was professor and head of the Computer Engineering Department, Universidade Estadual do Rio Grande do Sul (UERGS).
\nHe is currently a Distinguished Lecturer of the IEEE Electron Devices Society. He was a Distinguished Lecturer of the IEEE Circuits and Systems Society (term 2010 to 2011).
\nHis research work is focused on reliability and yield of MOS devices and circuits, including low-frequency noise, bias temperature instability (BTI), radiation effects, and design techniques to improve yield and reliability.
\nHe has stablished successful collaborative work with different companies and research groups in Europe, North and South America.<\/p>\n","protected":false},"excerpt":{"rendered":"

Gilson Inacio Wirth Federal University of Rio Grande do Sul – Brazil Wednesday, Aug. 29 –\u00a013:40h – Malbec A SBCCI INVITED TALK: Charge Trapping Phenomena in MOSFETS: From Noise to Bias Temperature Instability Charge...<\/p>\n","protected":false},"author":685,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"jetpack_post_was_ever_published":false,"footnotes":""},"class_list":["post-999","page","type-page","status-publish","hentry"],"jetpack_sharing_enabled":true,"jetpack_shortlink":"https:\/\/wp.me\/P9e0OP-g7","jetpack_likes_enabled":false,"jetpack-related-posts":[{"id":986,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/program-schedule\/","url_meta":{"origin":999,"position":0},"title":"Program Schedule","author":"agostini","date":"18\/07\/2018","format":false,"excerpt":"Chip in the Pampa 2018 Schedule Monday, Aug. 27 9:00h Assemblage - Event Registration 13:40h Pinot C - Meeting of SBMicro Board 13:40h Pinot D - Meeting of SBC\/CECCI Board 15:40h Pinot Lobby - Coffee-Break 16:20h Pinot A - Meeting of SBCCI Steering Committee 16:20h Pinot B - Meeting of\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":1042,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbmicro-2018-technical-program\/","url_meta":{"origin":999,"position":1},"title":"SBMicro 2018 Technical Program","author":"agostini","date":"19\/07\/2018","format":false,"excerpt":"SBMicro 2018 Final Technical Program \u00a0 Tuesday, Aug. 28 \u00a0 9:00h Malbec B \u2013 Tutorial Integrated switched-capacitor DC-DC converters for high-density capacitive energy storage Filip Tavernier (KU Leuven \u2013 Belgium) 10:20h Carmen\u00e8re - Coffee-Break 10:40h Malbec A \u2013 Tutorial DC and RF reliability of advanced CMOS technologies Edmundo Gutierrez (INAOE\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":674,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbmicro-2018-mohammad-al-faruque\/","url_meta":{"origin":999,"position":2},"title":"Tutorial: Edmundo Gutierrez","author":"agostini","date":"26\/04\/2018","format":false,"excerpt":"Edmundo Gutierrez National Institute of Astrophysics, Optics and Electronics (INAOE) - Mexico Tuesday, Aug. 28 - 10:40h -\u00a0Malbec A \u00a0 TUTORIAL: DC and RF reliability of advanced CMOS technologies I review the different experimental strategies and models to stress and degrade CMOS devices under DC and RF conditions. Based on\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/21edmundo-333x400.jpg?resize=350%2C200&ssl=1","width":350,"height":200},"classes":[]},{"id":959,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/tutorial-fernando-guarin\/","url_meta":{"origin":999,"position":3},"title":"Tutorial: Fernando Guarin","author":"agostini","date":"16\/07\/2018","format":false,"excerpt":"Fernando Guarin GlobalFoundries East Fishkill - USA Tuesday, Aug. 28 - 16:20h -\u00a0Malbec A TUTORIAL Reliability challenges for the qualification of Leading Edge Silicon CMOS Technologies including RF Applications This presentation will address some of the key reliability challenges during the qualification of \u00a0leading edge CMOS technologies.\u00a0 Some of the\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/07\/F_Guarin.jpg?resize=350%2C200&ssl=1","width":350,"height":200},"classes":[]},{"id":1049,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/inscit-2018-technical-program\/","url_meta":{"origin":999,"position":4},"title":"INSCIT 2018 Technical Program","author":"agostini","date":"19\/07\/2018","format":false,"excerpt":"INSCIT 2018 Final Technical Program Tuesday, Aug. 28 SBCCI\/SBMicro Tutorials \u00a0 Wednesday, Aug. 29 9:00h Malbec B \u2013 Keynote Automatic Customizable Computing: From DSLs to FPGAs for Deep Learning and Beyond Jason Cong (UCLA - USA) 10:20h Carmen\u00e8re \u2013 Coffee-Break 10:40h Pinot A\u00a0\u2013 INSCIT Invited Talk Acoustic wave sensors for\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":1025,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/inscit-invited-talk-ollivier-tamarin\/","url_meta":{"origin":999,"position":5},"title":"INSCIT INVITED TALK: Ollivier Tamarin","author":"agostini","date":"19\/07\/2018","format":false,"excerpt":"Ollivier Tamarin French West Indies University - France Wednesday, Aug. 29 - 10:40h - Pinot A INVITED TALK: Acoustic wave sensors for biochemical sensing: Perspectives for in situ measurements in amazon rivers Monitoring the environment is a crucial issue for our planet, especially when the territory to be preserved is\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/07\/Ollivier_Tamarin-400x400.jpg?resize=350%2C200&ssl=1","width":350,"height":200},"classes":[]}],"_links":{"self":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages\/999","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/users\/685"}],"replies":[{"embeddable":true,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/comments?post=999"}],"version-history":[{"count":5,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages\/999\/revisions"}],"predecessor-version":[{"id":1516,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages\/999\/revisions\/1516"}],"wp:attachment":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/media?parent=999"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}