{"id":690,"date":"2018-04-27T17:40:14","date_gmt":"2018-04-27T20:40:14","guid":{"rendered":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/?page_id=690"},"modified":"2018-08-27T15:58:00","modified_gmt":"2018-08-27T18:58:00","slug":"sbcci-enrique-miranda","status":"publish","type":"page","link":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbcci-enrique-miranda\/","title":{"rendered":"Tutorial: Enrique Miranda"},"content":{"rendered":"<p style=\"text-align: center\"><strong><span style=\"font-size: 24pt\">Enrique Miranda<\/span><br \/>\n<span style=\"font-size: 14pt\">Universitat Aut\u00f2noma de Barcelona (UAB) &#8211; Spain<\/span><br \/>\n<\/strong><span style=\"font-size: 14pt\"><strong>Tuesday, Aug. 28 &#8211; 13:40h &#8211;\u00a0Malbec A<\/strong><\/span><\/p>\n<div id=\"attachment_694\" style=\"width: 287px\" class=\"wp-caption aligncenter\"><img data-recalc-dims=\"1\" loading=\"lazy\" decoding=\"async\" aria-describedby=\"caption-attachment-694\" data-attachment-id=\"694\" data-permalink=\"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbcci-enrique-miranda\/emiranda\/\" data-orig-file=\"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/EMiranda.jpg?fit=704%2C1017&amp;ssl=1\" data-orig-size=\"704,1017\" data-comments-opened=\"0\" data-image-meta=\"{&quot;aperture&quot;:&quot;0&quot;,&quot;credit&quot;:&quot;&quot;,&quot;camera&quot;:&quot;&quot;,&quot;caption&quot;:&quot;&quot;,&quot;created_timestamp&quot;:&quot;1479984180&quot;,&quot;copyright&quot;:&quot;&quot;,&quot;focal_length&quot;:&quot;0&quot;,&quot;iso&quot;:&quot;0&quot;,&quot;shutter_speed&quot;:&quot;0&quot;,&quot;title&quot;:&quot;&quot;,&quot;orientation&quot;:&quot;1&quot;}\" data-image-title=\"EMiranda\" data-image-description=\"\" data-image-caption=\"&lt;p&gt;Enrique Miranda&lt;\/p&gt;\n\" data-medium-file=\"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/EMiranda.jpg?fit=277%2C400&amp;ssl=1\" data-large-file=\"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/EMiranda.jpg?fit=704%2C1017&amp;ssl=1\" class=\"wp-image-694 size-medium\" style=\"font-size: 16px\" src=\"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/EMiranda.jpg?resize=277%2C400&#038;ssl=1\" alt=\"\" width=\"277\" height=\"400\" srcset=\"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/EMiranda.jpg?resize=277%2C400&amp;ssl=1 277w, https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/EMiranda.jpg?w=704&amp;ssl=1 704w\" sizes=\"auto, (max-width: 277px) 100vw, 277px\" \/><p id=\"caption-attachment-694\" class=\"wp-caption-text\"><strong>Enrique Miranda<\/strong><\/p><\/div>\n<h2 style=\"text-align: left\"><strong>TUTORIAL:<br \/>\nCompact modeling of hysteresis effects in ReRAM devices<\/strong><\/h2>\n<p style=\"text-align: justify\">Resistive switching (RS) of thin oxides is called to be the next breakthrough in the field of memory devices and neuromorphic computation. Devices based on this mechanism can, under an appropriate electrical stimulus, reversibly change their resistance state and retain this value even when the power is turned off. This is a nonvolatile effect based on the formation and dissolution of filamentary pathways spanning the dielectric film that substitutes the storage charge principle used in conventional memory devices. In this presentation, the hysteresis effects associated with RS in resistive RAMs, the connection with Chua\u2019s memristive systems and the implementation of compact models for these devices in LTSpice will be discussed.<\/p>\n<h2 style=\"text-align: left\" align=\"justify\"><strong>Speaker&#8217;s Biography:<\/strong><\/h2>\n<p style=\"text-align: justify\" align=\"justify\">EM is Professor at the Universitat Aut\u00f2noma de Barcelona (UAB), Spain. He has a PhD in Electronics Engineering from the UAB (1999) and a PhD in Physics from the Universidad de Buenos Aires, Argentina (2001). He received numerous scholarships and awards including: INTERCAMPUS (Universidad de Zaragoza, Spain), MUTIS (UAB), RAMON y CAJAL (UAB), from DAAD (Technical University Hamburg-Harburg), from the italian government (Universita degli Studi di Padova), MATSUMAE (Tokyo Institute of Technology, Japan), TAN CHIN TUAN (Nanyang Technological University, Singapore), WALTON award from Science Foundation Ireland (Tyndall National Institute), Distinguished Visitor Award (Royal Academy of Engineering, UK), CESAR MILSTEIN (CNEA, Argentina), Visiting Professorships from Slovak Academy of Sciences and Leverhulme Trust (University College London, UK). He serves as member of the Distinguished Lecturer program of the Electron Devices Society (EDS-IEEE) since 2001 and as Editorial Advisor of the journal Microelectronics Reliability since 2003. He forms or has formed part of INFOS, IRPS, ESREF, MIEL, E-MRS, ESSDERC, and IPFA Technical or Steering Committees. EM was visiting scientist at the Indian Institute of Technology-India, IHP-Germany, Universita di Napoli, Modena, Cagliari-Italy, and Soochow University-China. He has authored and co-authored around 200 peer-review journal papers most of them devoted to the electron transport mechanisms in thin dielectric films.<\/p>\n<p align=\"justify\"><em><span style=\"font-size: 18pt\"><strong>Tutorial realized together with the 2018 EDS Brazil Mini-Colloquium, co-organized by EDS FEI Student Chapter.\u00a0<\/strong><\/span><\/em><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Enrique Miranda Universitat Aut\u00f2noma de Barcelona (UAB) &#8211; Spain Tuesday, Aug. 28 &#8211; 13:40h &#8211;\u00a0Malbec A TUTORIAL: Compact modeling of hysteresis effects in ReRAM devices Resistive switching (RS) of thin oxides is called to&#46;&#46;&#46;<\/p>\n","protected":false},"author":685,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"jetpack_post_was_ever_published":false,"footnotes":""},"class_list":["post-690","page","type-page","status-publish","hentry"],"jetpack_sharing_enabled":true,"jetpack_shortlink":"https:\/\/wp.me\/P9e0OP-b8","jetpack_likes_enabled":false,"jetpack-related-posts":[{"id":1095,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sforum-2018-technical-program\/","url_meta":{"origin":690,"position":0},"title":"SFORUM 2018 Technical Program","author":"agostini","date":"23\/07\/2018","format":false,"excerpt":"SForum 2018 Final Technical Program Tuesday, Aug. 28 9:00h Malbec B \u2013 Tutorial Integrated switched-capacitor DC-DC converters for high-density capacitive energy storage Filip Tavernier (KU Leuven \u2013 Belgium) 10:20h Carmen\u00e8re - Coffee-Break 10:40h Malbec A \u2013 Tutorial DC and RF reliability of advanced CMOS technologies Edmundo Gutierrez (INAOE \u2013 Mexico)\u00a0\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":986,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/program-schedule\/","url_meta":{"origin":690,"position":1},"title":"Program Schedule","author":"agostini","date":"18\/07\/2018","format":false,"excerpt":"Chip in the Pampa 2018 Schedule Monday, Aug. 27 9:00h Assemblage - Event Registration 13:40h Pinot C - Meeting of SBMicro Board 13:40h Pinot D - Meeting of SBC\/CECCI Board 15:40h Pinot Lobby - Coffee-Break 16:20h Pinot A - Meeting of SBCCI Steering Committee 16:20h Pinot B - Meeting of\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":1057,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wcas-2018-technical-program\/","url_meta":{"origin":690,"position":2},"title":"WCAS 2018 Technical Program","author":"agostini","date":"19\/07\/2018","format":false,"excerpt":"WCAS 2018 Final Technical Program Tuesday, Aug. 28 9:00h Malbec B \u2013 Tutorial Integrated switched-capacitor DC-DC converters for high-density capacitive energy storage Filip Tavernier (KU Leuven \u2013 Belgium) 10:20h Carmen\u00e8re - Coffee-Break 10:40h Malbec A \u2013 Tutorial DC and RF reliability of advanced CMOS technologies Edmundo Gutierrez (INAOE \u2013 Mexico)\u00a0\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":1042,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbmicro-2018-technical-program\/","url_meta":{"origin":690,"position":3},"title":"SBMicro 2018 Technical Program","author":"agostini","date":"19\/07\/2018","format":false,"excerpt":"SBMicro 2018 Final Technical Program \u00a0 Tuesday, Aug. 28 \u00a0 9:00h Malbec B \u2013 Tutorial Integrated switched-capacitor DC-DC converters for high-density capacitive energy storage Filip Tavernier (KU Leuven \u2013 Belgium) 10:20h Carmen\u00e8re - Coffee-Break 10:40h Malbec A \u2013 Tutorial DC and RF reliability of advanced CMOS technologies Edmundo Gutierrez (INAOE\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":1039,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbcci-2018-technical-program\/","url_meta":{"origin":690,"position":4},"title":"SBCCI 2018 Technical Program","author":"agostini","date":"19\/07\/2018","format":false,"excerpt":"SBCCI 2018 Final Technical Program Papers assigned with an asterisk are the SBCCI2018 Best Paper Candidates. Tuesday, Aug. 28 9:00h Malbec B \u2013 Tutorial Integrated switched-capacitor DC-DC converters for high-density capacitive energy storage Filip Tavernier (KU Leuven \u2013 Belgium) 10:20h Carmen\u00e8re - Coffee-Break 10:40h Malbec A \u2013 Tutorial DC and\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":674,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbmicro-2018-mohammad-al-faruque\/","url_meta":{"origin":690,"position":5},"title":"Tutorial: Edmundo Gutierrez","author":"agostini","date":"26\/04\/2018","format":false,"excerpt":"Edmundo Gutierrez National Institute of Astrophysics, Optics and Electronics (INAOE) - Mexico Tuesday, Aug. 28 - 10:40h -\u00a0Malbec A \u00a0 TUTORIAL: DC and RF reliability of advanced CMOS technologies I review the different experimental strategies and models to stress and degrade CMOS devices under DC and RF conditions. Based on\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/21edmundo-333x400.jpg?resize=350%2C200&ssl=1","width":350,"height":200},"classes":[]}],"_links":{"self":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages\/690","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/users\/685"}],"replies":[{"embeddable":true,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/comments?post=690"}],"version-history":[{"count":12,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages\/690\/revisions"}],"predecessor-version":[{"id":1595,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages\/690\/revisions\/1595"}],"wp:attachment":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/media?parent=690"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}