{"id":674,"date":"2018-04-26T15:25:57","date_gmt":"2018-04-26T18:25:57","guid":{"rendered":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/?page_id=674"},"modified":"2018-08-27T15:56:41","modified_gmt":"2018-08-27T18:56:41","slug":"sbmicro-2018-mohammad-al-faruque","status":"publish","type":"page","link":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbmicro-2018-mohammad-al-faruque\/","title":{"rendered":"Tutorial: Edmundo Gutierrez"},"content":{"rendered":"<p style=\"text-align: center\"><strong><span style=\"font-size: 24pt\">Edmundo Gutierrez<\/span><br \/>\n<span style=\"font-size: 14pt\">National Institute of Astrophysics, Optics and Electronics (INAOE) &#8211; Mexico<\/span><br \/>\n<\/strong><span style=\"font-size: 14pt\"><strong>Tuesday, Aug. 28 &#8211; 10:40h &#8211;\u00a0Malbec A<\/strong><\/span><\/p>\n<div id=\"attachment_676\" style=\"width: 343px\" class=\"wp-caption aligncenter\"><img data-recalc-dims=\"1\" loading=\"lazy\" decoding=\"async\" aria-describedby=\"caption-attachment-676\" data-attachment-id=\"676\" data-permalink=\"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbmicro-2018-mohammad-al-faruque\/21edmundo\/\" data-orig-file=\"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/21edmundo.jpg?fit=625%2C750&amp;ssl=1\" data-orig-size=\"625,750\" data-comments-opened=\"0\" data-image-meta=\"{&quot;aperture&quot;:&quot;0&quot;,&quot;credit&quot;:&quot;&quot;,&quot;camera&quot;:&quot;&quot;,&quot;caption&quot;:&quot;&quot;,&quot;created_timestamp&quot;:&quot;0&quot;,&quot;copyright&quot;:&quot;&quot;,&quot;focal_length&quot;:&quot;0&quot;,&quot;iso&quot;:&quot;0&quot;,&quot;shutter_speed&quot;:&quot;0&quot;,&quot;title&quot;:&quot;&quot;,&quot;orientation&quot;:&quot;1&quot;}\" data-image-title=\"Edmundo\" data-image-description=\"\" data-image-caption=\"&lt;p&gt;Edmundo Gutierrez&lt;\/p&gt;\n\" data-medium-file=\"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/21edmundo.jpg?fit=333%2C400&amp;ssl=1\" data-large-file=\"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/21edmundo.jpg?fit=625%2C750&amp;ssl=1\" class=\"wp-image-676 size-medium\" style=\"font-size: 16px\" src=\"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/21edmundo.jpg?resize=333%2C400&#038;ssl=1\" alt=\"\" width=\"333\" height=\"400\" srcset=\"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/21edmundo.jpg?resize=333%2C400&amp;ssl=1 333w, https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/04\/21edmundo.jpg?w=625&amp;ssl=1 625w\" sizes=\"auto, (max-width: 333px) 100vw, 333px\" \/><p id=\"caption-attachment-676\" class=\"wp-caption-text\"><strong>Edmundo Gutierrez<\/strong><\/p><\/div>\n<p>&nbsp;<\/p>\n<h2 style=\"text-align: left\"><strong>TUTORIAL:<br \/>\nDC and RF reliability of advanced CMOS technologies<\/strong><\/h2>\n<p style=\"text-align: justify\">I review the different experimental strategies and models to stress and degrade CMOS devices under DC and RF conditions. Based on the experimental results different reliability models for different CMOS technologies are introduced. We found out that RF stress causes a larger degradation or lesser reliability than DC stress. The experiments and models are introduced and analysed from DC up to 65 GHz.<\/p>\n<h2 style=\"text-align: left\" align=\"justify\"><strong>Speaker&#8217;s Biography:<\/strong><\/h2>\n<p style=\"text-align: justify\" align=\"justify\">Prof Guti\u00e9rrez-D. received his PhD from the Catholic University of Leuven, Belgium in 1993, with the thesis entitled \u201cElectrical performance of submicron CMOS technologies from 300 K down to 4.2K\u201d. From 1988 to 1993 was a research assistant at the Interuniversity Microelectronics Center (IMEC) in Leuven, Belgium. In 1993 joined as a researcher the Department of Electronics of INAOE. In 1996 spent one year as invited Professor at the Simon Fraser University in Vancouver, Canada. In 1996 he also spent two months at the University of Sao Paulo, Brazil as a Summer PhD lecturer. From 1999 to 2000 was appointed Head of the INAOE Department of Electronics. From 2000 to 2002 spent two years as Design Manager of the Motorola Mexico Center for Semiconductor Technology in Puebla City. In 2002 he was also invited Professor at the Technical University of Vienna, Austria. From 2002 to 2005 rejoined INAOE as Professor of the Department of Electronics. From 2005 to 2007 was the Research Manager of the Intel Systems Research Center Mexico in Guadalajara City.<\/p>\n<p style=\"text-align: justify\" align=\"justify\">Prof. Guti\u00e9rrez is author of the books \u201cLow Temperature Electronics, Physics, Devices, Circuits and Applications\u201d (Academic Press, 2000), and \u201cNano-Scaled Semiconductor Devices, Physics, Modelling, Characterisation, and Societal Impact\u201d, IET Press, 2016. He has supervised 7 M.Sc. and 13 PhD theses, and has published more than 120 scientific papers and conferences in the field of physics of semiconductor materials and devices, including MOS transistors, temperature, optical, and magnetic sensors.<\/p>\n<p style=\"text-align: justify\" align=\"justify\">Prof. Guti\u00e9rrez-D. is Associate Editor of Electron Device Letters.<br \/>\nCurrently Prof. Gutierrez is with the Department of Electronics of the National Institute of Astrophysics, Optics and Electronics (INAOE) in Puebla, Mexico. Prof. Guti\u00e9rrez is member of different Review Committees of the Mexico National Council of Science and Technology (CONACyT), and Senior Member of the IEEE organization.<\/p>\n<p align=\"justify\"><em><span style=\"font-size: 18pt\"><strong>Tutorial realized together with the 2018 EDS Brazil Mini-Colloquium, co-organized by EDS FEI Student Chapter.\u00a0<\/strong><\/span><\/em><\/p>\n<p align=\"justify\">\n","protected":false},"excerpt":{"rendered":"<p>Edmundo Gutierrez National Institute of Astrophysics, Optics and Electronics (INAOE) &#8211; Mexico Tuesday, Aug. 28 &#8211; 10:40h &#8211;\u00a0Malbec A &nbsp; TUTORIAL: DC and RF reliability of advanced CMOS technologies I review the different experimental&#46;&#46;&#46;<\/p>\n","protected":false},"author":685,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"jetpack_post_was_ever_published":false,"footnotes":""},"class_list":["post-674","page","type-page","status-publish","hentry"],"jetpack_sharing_enabled":true,"jetpack_shortlink":"https:\/\/wp.me\/P9e0OP-aS","jetpack_likes_enabled":false,"jetpack-related-posts":[{"id":1095,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sforum-2018-technical-program\/","url_meta":{"origin":674,"position":0},"title":"SFORUM 2018 Technical Program","author":"agostini","date":"23\/07\/2018","format":false,"excerpt":"SForum 2018 Final Technical Program Tuesday, Aug. 28 9:00h Malbec B \u2013 Tutorial Integrated switched-capacitor DC-DC converters for high-density capacitive energy storage Filip Tavernier (KU Leuven \u2013 Belgium) 10:20h Carmen\u00e8re - Coffee-Break 10:40h Malbec A \u2013 Tutorial DC and RF reliability of advanced CMOS technologies Edmundo Gutierrez (INAOE \u2013 Mexico)\u00a0\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":1057,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wcas-2018-technical-program\/","url_meta":{"origin":674,"position":1},"title":"WCAS 2018 Technical Program","author":"agostini","date":"19\/07\/2018","format":false,"excerpt":"WCAS 2018 Final Technical Program Tuesday, Aug. 28 9:00h Malbec B \u2013 Tutorial Integrated switched-capacitor DC-DC converters for high-density capacitive energy storage Filip Tavernier (KU Leuven \u2013 Belgium) 10:20h Carmen\u00e8re - Coffee-Break 10:40h Malbec A \u2013 Tutorial DC and RF reliability of advanced CMOS technologies Edmundo Gutierrez (INAOE \u2013 Mexico)\u00a0\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":986,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/program-schedule\/","url_meta":{"origin":674,"position":2},"title":"Program Schedule","author":"agostini","date":"18\/07\/2018","format":false,"excerpt":"Chip in the Pampa 2018 Schedule Monday, Aug. 27 9:00h Assemblage - Event Registration 13:40h Pinot C - Meeting of SBMicro Board 13:40h Pinot D - Meeting of SBC\/CECCI Board 15:40h Pinot Lobby - Coffee-Break 16:20h Pinot A - Meeting of SBCCI Steering Committee 16:20h Pinot B - Meeting of\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":1039,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbcci-2018-technical-program\/","url_meta":{"origin":674,"position":3},"title":"SBCCI 2018 Technical Program","author":"agostini","date":"19\/07\/2018","format":false,"excerpt":"SBCCI 2018 Final Technical Program Papers assigned with an asterisk are the SBCCI2018 Best Paper Candidates. Tuesday, Aug. 28 9:00h Malbec B \u2013 Tutorial Integrated switched-capacitor DC-DC converters for high-density capacitive energy storage Filip Tavernier (KU Leuven \u2013 Belgium) 10:20h Carmen\u00e8re - Coffee-Break 10:40h Malbec A \u2013 Tutorial DC and\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]},{"id":959,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/tutorial-fernando-guarin\/","url_meta":{"origin":674,"position":4},"title":"Tutorial: Fernando Guarin","author":"agostini","date":"16\/07\/2018","format":false,"excerpt":"Fernando Guarin GlobalFoundries East Fishkill - USA Tuesday, Aug. 28 - 16:20h -\u00a0Malbec A TUTORIAL Reliability challenges for the qualification of Leading Edge Silicon CMOS Technologies including RF Applications This presentation will address some of the key reliability challenges during the qualification of \u00a0leading edge CMOS technologies.\u00a0 Some of the\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"https:\/\/i0.wp.com\/wp.ufpel.edu.br\/chipinthepampa2018\/files\/2018\/07\/F_Guarin.jpg?resize=350%2C200&ssl=1","width":350,"height":200},"classes":[]},{"id":1042,"url":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/sbmicro-2018-technical-program\/","url_meta":{"origin":674,"position":5},"title":"SBMicro 2018 Technical Program","author":"agostini","date":"19\/07\/2018","format":false,"excerpt":"SBMicro 2018 Final Technical Program \u00a0 Tuesday, Aug. 28 \u00a0 9:00h Malbec B \u2013 Tutorial Integrated switched-capacitor DC-DC converters for high-density capacitive energy storage Filip Tavernier (KU Leuven \u2013 Belgium) 10:20h Carmen\u00e8re - Coffee-Break 10:40h Malbec A \u2013 Tutorial DC and RF reliability of advanced CMOS technologies Edmundo Gutierrez (INAOE\u2026","rel":"","context":"Post similar","block_context":{"text":"Post similar","link":""},"img":{"alt_text":"","src":"","width":0,"height":0},"classes":[]}],"_links":{"self":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages\/674","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/users\/685"}],"replies":[{"embeddable":true,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/comments?post=674"}],"version-history":[{"count":10,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages\/674\/revisions"}],"predecessor-version":[{"id":1594,"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/pages\/674\/revisions\/1594"}],"wp:attachment":[{"href":"https:\/\/wp.ufpel.edu.br\/chipinthepampa2018\/wp-json\/wp\/v2\/media?parent=674"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}